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2006 Tools of the Trade
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NanoWorld™ announces Pyrex-Nitride AFM Probe

 

 

Pyrex-Nitride AFM Probe

 

Neuchâtel/Switzerland, February 17, 2006 .

NanoWorld has officially announced its new Pyrex-Nitride AFM probe.

The Pyrex-Nitride probe combines silicon nitride cantilevers and tips with the proven glass chip concept. These new probes will be available as rectangular cantilevers as well as in a triangular version. The Pyrex-Nitride series has been designed for a great variety of imaging techniques like in air and liquid. The cantilevers have a backside reflective coating of chromium and gold.

The Pyrex-Nitride probes will become commercially available in June 2006.

For further information or if you would like to receive a free sample of the newly announced product you are welcome to visit our website at www.nanoworld.com or contact us at info@nanoworld.com .

About NanoWorld AG:

Swiss-based NanoWorld AG (www.nanoworld.com) is a leading manufacturer of high quality tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM). The Atomic Force Microscope (AFM) is the vital instrument for the whole field of nanoscience and nanotech nology. It enables its user coming from research and commercial nanotech nology businesses to investigate materials on an atomic scale. Scanning probes for Atomic Force Microscopy produced by NanoWorld AG are the key consumable, the “finger” that enables the scientist to scan surfaces point-by-point on an atomic scale. The consistent high quality of the scanning probes is vital for reproducible results.

Using NanoWorld's expertise as well as our high precision AFM Probes, our clients are able to get the best results they need for atomic force microscopy (AFM).

 



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